Abstract
Entanglement and correlation are at the basis of quantum mechanics and have been used in optics to create a framework for “ghost imaging”. We propose that a similar scheme can be used in an electron microscope to exploit the correlation of electrons with the coincident detection of collective mode excitations in a sample. In this way, an image of the sample can be formed on an electron camera even if electrons never illuminated the region of interest directly. This concept, which can be regarded as the inverse of photon-induced near-field electron microscopy, can be used to probe delicate molecules with a resolution that is beyond the wavelength of the collective mode.
Original language | English |
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Pages (from-to) | 1708-1715 |
Number of pages | 8 |
Journal | ACS Photonics |
Volume | 10 |
Issue number | 6 |
DOIs | |
State | Published - 21 Jun 2023 |
Keywords
- electron beam shaping
- electron microscopy
- electron-light entanglement
- electron−light interaction
- ultrafast dynamics
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Biotechnology
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering