Abstract
Thin Au-Fe bilayers were deposited on c-plane sapphire (α-Al 2O3) substrates at room temperature employing the electron beam deposition method. The layers were found to be single crystalline (i.e. the grain size was much larger than the film thickness), with a [1 1 1] and [1 1 0] texture for Au and Fe, respectively, and strong heteroepitaxy to the substrate. Au films deposited on sapphire and Au-Fe bilayers deposited on amorphous SiO2 were polycrystalline and exhibited random in-plane orientation of the grains. The effects of Fe and the Fe-sapphire interface on the microstructure of the Au film were investigated and discussed in terms of the orientation relationships, in-plane strain, interface energy and adhesion. The microstructures of annealed and as-deposited films were very similar, indicating that as-deposited films are close to thermodynamic equilibrium in terms of the orientation relationship with the substrate. This is uncommon for non-equilibrium thin film deposition processes, which usually result in a high density of defects in the as-deposited films.
Original language | English |
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Pages (from-to) | 4113-4126 |
Number of pages | 14 |
Journal | Acta Materialia |
Volume | 61 |
Issue number | 11 |
DOIs | |
State | Published - Jun 2013 |
Keywords
- Epitaxial growth
- Gold-iron
- Metal-ceramic interfaces
- Seed layer
- Thin films
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Polymers and Plastics
- Metals and Alloys