On the direction of the conductive filament growth in valence change memory devices during electroforming

D. Kalaev, E. Yalon, I. Riess

Research output: Contribution to journalArticlepeer-review

Abstract

We discuss theoretically the filament growth direction in valence change memory (VCM) devices and show that this direction is determined by kinetic considerations. It is being fixed by the relation between the kinetics of ion transfer at the electrodes and that of ion transfer through the bulk. Considering a filament consisting of donors (oxygen vacancies) the direction of growth is from the cathode when the anode ion kinetics is limited in comparison to fast ion kinetics in the bulk of the oxide. In the opposite case the filament grows from the anode side. The filament may in some cases extend between the two electrodes while in others leave a narrow insulating gap under the anode.

Original languageEnglish
Pages (from-to)9-17
Number of pages9
JournalSolid State Ionics
Volume276
DOIs
StatePublished - 1 Aug 2015

Keywords

  • Defect distribution
  • Electroforming
  • Filament
  • Filament growth direction
  • Memristors
  • Mixed-ionic-electronic-conductor

All Science Journal Classification (ASJC) codes

  • General Chemistry
  • Condensed Matter Physics
  • General Materials Science

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