@inproceedings{86fa89d842dd4fc0a7893aafd8e4e99d,
title = "Novel beam shaping based all optical measurement method for free charge carriers dynamics in silicon",
abstract = "We demonstrate a new experimental algorithm for the diffusion length all optical measurement. This Measurement method is based on a novel Plasma Dispersion Effect based on beam shaping method that we demonstrated in the past.",
author = "Maor Tiferet and Nadav Shabairou and Zeev Zalevsky and Moshe Sinvani",
note = "Publisher Copyright: {\textcopyright} OSA 2020 {\textcopyright} 2020 The Author(s); 2020 Frontiers in Optics Conference, FiO 2020 ; Conference date: 14-09-2020 Through 17-09-2020",
year = "2020",
month = sep,
day = "14",
doi = "10.1364/FIO.2020.JTu1A.17",
language = "الإنجليزيّة",
series = "Optics InfoBase Conference Papers",
publisher = "Optica Publishing Group (formerly OSA)",
booktitle = "Frontiers in Optics - Proceedings Frontiers in Optics / Laser Science, Part of Frontiers in Optics + Laser Science APS/DLS, FiO 2020",
}