Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy

X. H. Kong; H. X. Ji; R. D. Piner; H. F. Li; C. W. Magnuson; C. Tan; A. Ismach; H. Chou; R. S. Ruoff

doi:https://doi.org/10.1063/1.4816752

Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy

X. H. Kong, H. X. Ji, R. D. Piner, H. F. Li, C. W. Magnuson, C. Tan, A. Ismach, H. Chou, R. S. Ruoff

Research output: Contribution to journal › Article › peer-review

Abstract

Non-destructive and rapid evaluation of graphene directly on the growth substrate (Cu foils) by dark field (DF) optical microscopy is demonstrated. Without any additional treatment, graphene on Cu foils with various coverages can be quickly identified by DF imaging immediately after chemical vapor deposition growth with contrast comparable to scanning electron microscopy. The improved contrast of DF imaging compared to bright field optical imaging was found to be due to Rayleigh scattering of light by the copper steps beneath graphene. Indeed, graphene adlayers are readily distinguished, due to the different height of copper steps beneath graphene regions of different thickness.

Original language	English
Article number	043119
Journal	Applied Physics Letters
Volume	103
Issue number	4
DOIs	https://doi.org/10.1063/1.4816752
State	Published - 22 Jul 2013
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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https://doi.org/10.1063/1.4816752

Cite this

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title = "Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy",

abstract = "Non-destructive and rapid evaluation of graphene directly on the growth substrate (Cu foils) by dark field (DF) optical microscopy is demonstrated. Without any additional treatment, graphene on Cu foils with various coverages can be quickly identified by DF imaging immediately after chemical vapor deposition growth with contrast comparable to scanning electron microscopy. The improved contrast of DF imaging compared to bright field optical imaging was found to be due to Rayleigh scattering of light by the copper steps beneath graphene. Indeed, graphene adlayers are readily distinguished, due to the different height of copper steps beneath graphene regions of different thickness.",

author = "Kong, {X. H.} and Ji, {H. X.} and Piner, {R. D.} and Li, {H. F.} and Magnuson, {C. W.} and C. Tan and A. Ismach and H. Chou and Ruoff, {R. S.}",

note = "Funding Information: We appreciate support from the W. M. Keck Foundation, the Office of Naval Research, and the Army Research Office (Grant W911NF1010428), and comments by Dr. L. Colombo.",

year = "2013",

month = jul,

day = "22",

doi = "https://doi.org/10.1063/1.4816752",

language = "الإنجليزيّة",

volume = "103",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "4",

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TY - JOUR

T1 - Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy

AU - Kong, X. H.

AU - Ji, H. X.

AU - Piner, R. D.

AU - Li, H. F.

AU - Magnuson, C. W.

AU - Tan, C.

AU - Ismach, A.

AU - Chou, H.

AU - Ruoff, R. S.

N1 - Funding Information: We appreciate support from the W. M. Keck Foundation, the Office of Naval Research, and the Army Research Office (Grant W911NF1010428), and comments by Dr. L. Colombo.

PY - 2013/7/22

Y1 - 2013/7/22

N2 - Non-destructive and rapid evaluation of graphene directly on the growth substrate (Cu foils) by dark field (DF) optical microscopy is demonstrated. Without any additional treatment, graphene on Cu foils with various coverages can be quickly identified by DF imaging immediately after chemical vapor deposition growth with contrast comparable to scanning electron microscopy. The improved contrast of DF imaging compared to bright field optical imaging was found to be due to Rayleigh scattering of light by the copper steps beneath graphene. Indeed, graphene adlayers are readily distinguished, due to the different height of copper steps beneath graphene regions of different thickness.

AB - Non-destructive and rapid evaluation of graphene directly on the growth substrate (Cu foils) by dark field (DF) optical microscopy is demonstrated. Without any additional treatment, graphene on Cu foils with various coverages can be quickly identified by DF imaging immediately after chemical vapor deposition growth with contrast comparable to scanning electron microscopy. The improved contrast of DF imaging compared to bright field optical imaging was found to be due to Rayleigh scattering of light by the copper steps beneath graphene. Indeed, graphene adlayers are readily distinguished, due to the different height of copper steps beneath graphene regions of different thickness.

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U2 - https://doi.org/10.1063/1.4816752

DO - https://doi.org/10.1063/1.4816752

M3 - مقالة

SN - 0003-6951

VL - 103

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 4

M1 - 043119

ER -

Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy

Abstract

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