Nanooptics and electrons: From strong-field physics at needle tips to dielectric laser acceleration

Michael Krüger, Sebastian Thomas, John Breuer, Michael Förster, Dominik Ehberger, Jakob Hammer, Takuya Higuchi, Anoush Aghajani-Talesh, Joshua McNeur, Philipp Weber, Peter Hommelhoff

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We will report on control of electrons near nanoscale structures. In the first part of the talk, we will present results on strong-field physics in the near-field of a nanometer sharp needle tip. In particular, we will focus on field enhancement measurements with the laser-emitted electrons, and simulations thereof. In the second part we will show that charged particles can be efficiently and continuously accelerated with the optical carrier field of laser pulses provided that dielectric structures are employed to shape the phase front of the laser pulse. We show an experimental demonstration of dielectric laser acceleration of non-relativistic 30-keV electrons with a peak acceleration gradient of 25MeV/m, already on par with nowadays RF accelerators. With relativistic electrons, the acceleration gradient should exceed 1 GeV/m.

Original languageEnglish
Title of host publicationTechnical Digest - 2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014
EditorsHans-Heinrich Braun, Oliver Groening, Martin Paraliev, Thomas Feurer, Soichiro Tsujino, Jens Gobrecht
Pages3-4
Number of pages2
ISBN (Electronic)9781479953080
DOIs
StatePublished - 2014
Externally publishedYes
Event2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014 - Engelberg, Switzerland
Duration: 6 Jul 201410 Jul 2014

Publication series

NameTechnical Digest - 2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014

Conference

Conference2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014
Country/TerritorySwitzerland
CityEngelberg
Period6/07/1410/07/14

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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