Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

Elad Koren; Jonathan E. Allen; Uri Givani; Noel Berkovitch; Eric R. Hemesath; Lincoln J. Lauhon; Yossi Rosenwaks

Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

Elad Koren, Jonathan E. Allen, Uri Givani, Noel Berkovitch, Eric R. Hemesath, Lincoln J. Lauhon, Yossi Rosenwaks

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Original language	English
Title of host publication	Nanowires
Subtitle of host publication	Implementations and Applications
Editors	Abbass A Hashim
Publisher	InTech
Chapter	18
Pages	417-438
Number of pages	22
ISBN (Electronic)	978-953-51-4488-5
ISBN (Print)	9533073187, 9789533073187
State	Published - Jul 2011

Keywords

Open Access Collection

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Koren, E., Allen, J. E., Givani, U., Berkovitch, N., Hemesath, E. R., Lauhon, L. J., & Rosenwaks, Y. (2011). Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy. In A. A. Hashim (Ed.), Nanowires: Implementations and Applications (pp. 417-438). InTech. http://www.intechopen.com/articles/show/title/nano-scale-measurements-of-dopants-and-electronic-impurities-in-individual-silicon-nanowires-using-k

@inbook{bf6fa5b08b0a46338d8e878f5e9d012f,

title = "Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy",

keywords = "Open Access Collection",

author = "Elad Koren and Allen, {Jonathan E.} and Uri Givani and Noel Berkovitch and Hemesath, {Eric R.} and Lauhon, {Lincoln J.} and Yossi Rosenwaks",

year = "2011",

month = jul,

language = "الإنجليزيّة",

isbn = "9533073187",

pages = "417--438",

editor = "Hashim, {Abbass A}",

booktitle = "Nanowires",

publisher = "InTech",

address = "كرواتيا",

}

Koren, E, Allen, JE, Givani, U, Berkovitch, N, Hemesath, ER, Lauhon, LJ & Rosenwaks, Y 2011, Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy. in AA Hashim (ed.), Nanowires: Implementations and Applications. InTech, pp. 417-438. <http://www.intechopen.com/articles/show/title/nano-scale-measurements-of-dopants-and-electronic-impurities-in-individual-silicon-nanowires-using-k>

TY - CHAP

T1 - Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy

AU - Koren, Elad

AU - Allen, Jonathan E.

AU - Givani, Uri

AU - Berkovitch, Noel

AU - Hemesath, Eric R.

AU - Lauhon, Lincoln J.

AU - Rosenwaks, Yossi

PY - 2011/7

Y1 - 2011/7

KW - Open Access Collection

M3 - فصل

SN - 9533073187

SN - 9789533073187

SP - 417

EP - 438

BT - Nanowires

A2 - Hashim, Abbass A

PB - InTech

ER -