Abstract
In this paper, we demonstrate simultaneous AFM/NSOM using a dual-tip normal tuning-fork based scanning probe microscope. By scanning two SPM probes simultaneously, one dedicated for AFM with a standard tip diameter of 20 nm, and the second having a 150 nm aperture NSOM fiber with 200 nm thick gold coating, we combine the benefits of ∼20 nm spatial resolution from the AFM tip with the spectral information of a near-field optical probe. The combination of simultaneous dual-tip scanning enables us to decouple the requirements for high resolution topography and probe functionality. Our method represents a marked shift from previous applications of multi-probe SPM where essentially a pump-probe methodology is implemented in which one tip scans the area around the second. As a model system, we apply dual-tip AFM/NSOM scanning to a sample of spin-cast nano-clustered Lumogen dyes, which show remarkable brightness and photochemical stability. We observe morphology features with a resolution of 20 nm, and a nearfield optical resolution of 150 nm, validating our approach.
Original language | English |
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Pages (from-to) | 117-124 |
Number of pages | 8 |
Journal | Nanophotonics |
Volume | 3 |
Issue number | 1-2 |
DOIs | |
State | Published - 1 Apr 2014 |
Keywords
- FRET
- Lumogen
- Multiprobe
- NSOM
- SPM
- Tuning fork probe
All Science Journal Classification (ASJC) codes
- Biotechnology
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering