Multifrequency near field scanning optical microscopy (MF-SNOM)

H. Greener, M. Mrejen, U. Arieli, H. Suchowski

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We introduce a novel excitation and detection scheme in near-field optical microscopy based on a multifrequency method. Using this method, we experimentally demonstrate enhanced sensitivity, implying improved spatial resolution in optical measurements.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO_AT 2018
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580422
DOIs
StatePublished - 2018
EventCLEO: Applications and Technology, CLEO_AT 2018 - San Jose, United States
Duration: 13 May 201818 May 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F92-CLEO_AT 2018

Conference

ConferenceCLEO: Applications and Technology, CLEO_AT 2018
Country/TerritoryUnited States
CitySan Jose
Period13/05/1818/05/18

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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