Morphology and growth of capped Ge/Si quantum dots

Yizhak Yacoby, Naomi Elfassy, Samit K. Ray, Raj K. Singha, Samaresh Das, Eyal Cohen, Shira Yochelis, Roy Clarke, Yossi Paltiel

Research output: Contribution to journalArticlepeer-review

Abstract

The morphology, atomic structure, and chemical composition of small (4 nm average height and 20 nm average diameter), dense capped MBE-grown Ge/Si quantum dots are studied using an energy-differential extension of the direct X-ray phasing method, COBRA. Our results lead to the following conclusions: (i) the quantum dot system has a partial wetting layer; (ii) in the lower parts of the dots, the Ge content is small and increases toward the top; and (iii) the contact angle between the dots and the substrate is acute, consistent with the presence of a wetting layer. A growth mechanism compatible with these findings is proposed.

Original languageEnglish
Article number1608
JournalJournal of Nanoparticle Research
Volume15
Issue number5
DOIs
StatePublished - May 2013

Keywords

  • MBE
  • Nano-crystals
  • Quantum dots
  • Self-assembly
  • X-ray crystallography

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • General Chemistry
  • Atomic and Molecular Physics, and Optics
  • Modelling and Simulation
  • General Materials Science
  • Condensed Matter Physics

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