Abstract
The morphology, atomic structure, and chemical composition of small (4 nm average height and 20 nm average diameter), dense capped MBE-grown Ge/Si quantum dots are studied using an energy-differential extension of the direct X-ray phasing method, COBRA. Our results lead to the following conclusions: (i) the quantum dot system has a partial wetting layer; (ii) in the lower parts of the dots, the Ge content is small and increases toward the top; and (iii) the contact angle between the dots and the substrate is acute, consistent with the presence of a wetting layer. A growth mechanism compatible with these findings is proposed.
| Original language | English |
|---|---|
| Article number | 1608 |
| Journal | Journal of Nanoparticle Research |
| Volume | 15 |
| Issue number | 5 |
| DOIs | |
| State | Published - May 2013 |
Keywords
- MBE
- Nano-crystals
- Quantum dots
- Self-assembly
- X-ray crystallography
All Science Journal Classification (ASJC) codes
- Bioengineering
- General Chemistry
- Atomic and Molecular Physics, and Optics
- Modelling and Simulation
- General Materials Science
- Condensed Matter Physics