Abstract
A thermal sensor is proposed for microprocessors, which compares the BJT voltage to a reference by converting both voltages to frequency and dividing the frequencies to result in a digital number. The sensor has an rms resolution of ±0.2C and an area of 0.02 mm at the 32-nm process node and 0.006 mm at 22 nm, including all digital processing circuitry. The conversion rate is between 2-20 kS/s, which enables it to capture fast transients on the CPU. It consumes 3.8/1.4 mW at 32/22 nm from an unregulated 1.4-V supply. The combination of speed, low power, and area make this sensor appropriate to measure hot-spots in microprocessors.
Original language | English |
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Article number | 6605620 |
Pages (from-to) | 2860-2867 |
Number of pages | 8 |
Journal | IEEE Journal of Solid-State Circuits |
Volume | 48 |
Issue number | 11 |
DOIs | |
State | Published - 2013 |
Externally published | Yes |
Keywords
- Analog
- CPU hot-spots
- Intel
- microprocessors
- thermal management
- thermal sensors
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering