MeV Resolution in Laser-Assisted Energy-Filtered Transmission Electron Microscopy

Enrico Pomarico, Ivan Madan, Gabriele Berruto, Giovanni Maria Vanacore, Kangpeng Wang, Ido Kaminer, F. Javier García De Abajo, Fabrizio Carbone

Research output: Contribution to journalArticlepeer-review

Abstract

The electronic, optical, and magnetic properties of quantum solids are determined by their low-energy (<100 meV) many-body excitations. Dynamical characterization and manipulation of such excitations rely on tools that combine nm-spatial, fsoral, and meV-spectral resolution. Currently, phonons and collective plasmon resonances can be imaged in nanostructures with atomic (sub-nm) and tens of meV space/energy resolution using state-of-the-art energy-filtered transmission electron microscopy (TEM), but only under static conditions, while fs-resolved measurements are common but lack spatial or energy resolution. Here, we demonstrate a new method of spectrally resolved photon-induced near-field electron microscopy (SRPINEM) that allows us to obtain nm-fs-resolved maps of nanoparticle plasmons with an energy resolution determined by the laser line width (20 meV in this work) and no longer limited by the electron beam and spectrometer energy spreading. This technique can be extended to any optically accessible low-energy mode, thus pushing TEM to a previously unattainable spectral domain with an unprecedented combination of space, energy, and temporal resolution.

Original languageEnglish
Pages (from-to)759-764
Number of pages6
JournalACS Photonics
Volume5
Issue number3
DOIs
StatePublished - 21 Mar 2018

Keywords

  • Ultrafast transmission electron microscopy
  • electron energy-loss spectroscopy
  • high-resolution microscopy
  • photon-induced near-field microscopy
  • plasmonics
  • surface-plasmon polaritons

All Science Journal Classification (ASJC) codes

  • Biotechnology
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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