Measures of quality-factor in gap-closing electrostatic resonators

S. Shmulevich, M. Lerman, D. Elata

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present analytic expressions and experimental verification for common measures of quality-factor in gap-closing electrostatic resonators. We show that peak-gain, peak-sharpness and logarithmic decrement are distinctively different and are not equal to the quality-factor of the system. The significance of this work is that it clarifies the correct way in which the performance of MEMS resonators should be reported to avoid ambiguity.

Original languageEnglish
Title of host publicationIEEE 26th International Conference on Micro Electro Mechanical Systems, MEMS 2013
Pages417-420
Number of pages4
DOIs
StatePublished - 2013
EventIEEE 26th International Conference on Micro Electro Mechanical Systems, MEMS 2013 - Taipei, Taiwan, Province of China
Duration: 20 Jan 201324 Jan 2013

Publication series

NameProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)

Conference

ConferenceIEEE 26th International Conference on Micro Electro Mechanical Systems, MEMS 2013
Country/TerritoryTaiwan, Province of China
CityTaipei
Period20/01/1324/01/13

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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