Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

Kyle S. McKay, Dustin A. Hite, Philip D. Kent, Shlomi Kotler, Dietrich Leibfried, Daniel H. Slichter, Andrew C. Wilson, David P. Pappas

Research output: Contribution to journalArticlepeer-review

Abstract

We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.

Original languageAmerican English
Article numberA23
JournalPhysical Review A
Volume104
Issue number5
DOIs
StatePublished - Nov 2021

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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