Making Memristive Processing-in-Memory Reliable

Orian Leitersdorf, Ronny Ronen, Shahar Kvatinsky

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Processing-in-memory (PIM) solutions vastly accelerate systems by reducing data transfer between computation and memory. Memristors possess a unique property that enables storage and logic within the same device, which is exploited in the memristive Memory Processing Unit (mMPU). The mMPU expands fundamental stateful logic techniques, such as IM-PLY, MAGIC and FELIX, to high-throughput parallel logic and arithmetic operations within the memory. Unfortunately, memristive processing-in-memory is highly vulnerable to soft errors and this massive parallelism is not compatible with traditional reliability techniques, such as error-correcting-code (ECC). In this paper, we discuss reliability techniques that efficiently support the mMPU by utilizing the same principles as the mMPU computation. We detail ECC techniques that utilize the unique properties of the mMPU for efficiently utilizing the massive parallelism. Furthermore, we present novel solutions for efficiently implementing triple modular redundancy (TMR). The short-term and long-term reliability of large-scale applications, such as neural-network acceleration, are evaluated. The analysis clearly demonstrates the importance of high-throughput reliability mechanisms for memristive processing-in-memory.

Original languageEnglish
Title of host publication2021 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021 - Proceedings
ISBN (Electronic)9781728182810
DOIs
StatePublished - 2021
Event28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021 - Dubai, United Arab Emirates
Duration: 28 Nov 20211 Dec 2021

Publication series

Name2021 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021 - Proceedings

Conference

Conference28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021
Country/TerritoryUnited Arab Emirates
CityDubai
Period28/11/211/12/21

Keywords

  • Processing-in-memory (PIM)
  • error correcting code (ECC)
  • memristor
  • reliability
  • soft errors
  • stateful logic
  • triple modular redundancy (TMR)

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

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