Abstract
This chapter examines DML performance, energy consumption, static noise margins, delay distribution, robustness, and other design metrics under low-voltage operation. It still focuses on the gate level and DML operations in subthreshold and near-threshold regions...
| Original language | English |
|---|---|
| Title of host publication | Dual Mode Logic |
| Place of Publication | Cham, Switzerland |
| Pages | 59-73 |
| Number of pages | 15 |
| DOIs | |
| State | Published - 16 Dec 2020 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- Adder
- CMOS
- DML
- Delay–energy
- Dynamic logic
- Logical effort
- Monte Carlo
- Near-threshold (NT)
- On-current
- Robustness
- Sizing
- Stacked transistors
- Static noise margin (SNM)
- Strong inversion
- Subthreshold (ST)
- Transregional model
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