TY - JOUR
T1 - Low-complexity array codes for random and clustered 4-erasures
AU - Cassuto, Yuval
AU - Bruck, Jehoshua
N1 - Funding Information: Manuscript received February 10, 2010; revised May 04, 2011; accepted May 25, 2011. Date of current version January 06, 2012. This work was supported in part by the Caltech Lee Center for Advanced Networking. Y. Cassuto was with the Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125 USA. He is now with the Department of Electrical Engineering, Technion-Israel Institute of Technology, Tech-nion City, Haifa 32000, Israel (e-mail: [email protected]). J. Bruck is with the Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125 USA (e-mail: [email protected]). Communicated by J.-P. Tillich, Associate Editor for Coding Theory. Digital Object Identifier 10.1109/TIT.2011.2171518 Funding Information: Dr. Bruck is a Fellow of the IEEE, a recipient of the Feynman Prize for Excellence in Teaching, a Sloan Research Fellowship, a National Science Foundation Young Investigator Award, an IBM Outstanding Innovation Award and an IBM Outstanding Technical Achievement Award.
PY - 2012/1
Y1 - 2012/1
N2 - A new family of low-complexity array codes is proposed for correcting 4 column erasures. The new codes are tailored for the new error model of clustered column erasures that captures the properties of high-order failure combinations in storage arrays. The model of clustered column erasures considers the number of erased columns, together with the number of clusters into which they fall, without pre-defining the sizes of the clusters. This model addresses the problem of correlated device failures in storage arrays, whereby each failure event may affect multiple devices in a single cluster. The new codes correct essentially all combinations of clustered 4 erasures, i.e., those combinations that fall into three or less clusters. The new codes are significantly more efficient, in all relevant complexity measures, than the best known 4-erasure correcting codes. These measures include encoding complexity, decoding complexity and update complexity.
AB - A new family of low-complexity array codes is proposed for correcting 4 column erasures. The new codes are tailored for the new error model of clustered column erasures that captures the properties of high-order failure combinations in storage arrays. The model of clustered column erasures considers the number of erased columns, together with the number of clusters into which they fall, without pre-defining the sizes of the clusters. This model addresses the problem of correlated device failures in storage arrays, whereby each failure event may affect multiple devices in a single cluster. The new codes correct essentially all combinations of clustered 4 erasures, i.e., those combinations that fall into three or less clusters. The new codes are significantly more efficient, in all relevant complexity measures, than the best known 4-erasure correcting codes. These measures include encoding complexity, decoding complexity and update complexity.
KW - Array codes
KW - clustered erasures
KW - correlated failures
KW - storage arrays
UR - http://www.scopus.com/inward/record.url?scp=84855685106&partnerID=8YFLogxK
U2 - 10.1109/TIT.2011.2171518
DO - 10.1109/TIT.2011.2171518
M3 - مقالة
SN - 0018-9448
VL - 58
SP - 146
EP - 158
JO - IEEE Transactions on Information Theory
JF - IEEE Transactions on Information Theory
IS - 1
M1 - 6121982
ER -