Light Emission in Metal–Semiconductor Tunnel Junctions: Direct Evidence for Electron Heating by Plasmon Decay: Direct Evidence for Electron Heating by Plasmon Decay

Keyphrases

• Light Emission 100%
• Electron Heating 100%
• Plasmon Decay 100%
• Metal Electrode 66%
• Applied Voltage 66%
• Gold Electrode 33%
• Strong Correlation 33%
• High Energy 33%
• Gold Layer 33%
• Insulator 33%
• Valence Band 33%
• Semiconductors 33%
• Linear Dependence 33%
• Aluminum Oxide 33%
• Emission Spectrum 33%
• Inelastic Tunneling 33%
• Plasmon 33%
• Plasmon Energy 33%
• Effective Electron Temperature 33%
• Electrically Driven Plasmons 33%

Material Science

• Silicon 100%
• Aluminum Oxide 50%