LIDIA: Lightweight learned image denoising with instance adaptation

Gregory Vaksman, Michael Elad, Peyman Milanfar

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Image denoising is a well studied problem with an extensive activity that has spread over several decades. Leading classical denoising methods are typically designed to exploit the inner structure in images by modeling local overlapping patches, and operating in an unsupervised fashion. In contrast, newcomers to this arena are supervised and universal neural-network-based methods that bypass this modeling altogether, targeting the inference goal directly and globally, tending to be deep and parameter heavy.This work proposes a novel lightweight learnable architecture for image denoising, using a combination of supervised and unsupervised training of it, the first aiming for a universal denoiser and the second for an instance adaptation. Our architecture embeds in it concepts taken from classical methods, leveraging patch processing, non-local self-similarity, representation sparsity and a multiscale treatment. Our proposed universal denoiser achieves near state-of-the-art results, while using a small fraction of the typical number of parameters. In addition, we introduce and demonstrate two highly effective ways for further boosting the denoising performance, by adapting this universal network to the input image. The code reproducing the results of this paper is available at https://github.com/grishavak/LIDIA-denoiser.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
Pages2220-2229
Number of pages10
ISBN (Electronic)9781728193601
DOIs
StatePublished - Jun 2020
Event2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States
Duration: 14 Jun 202019 Jun 2020

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2020-June

Conference

Conference2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
Country/TerritoryUnited States
CityVirtual, Online
Period14/06/2019/06/20

All Science Journal Classification (ASJC) codes

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'LIDIA: Lightweight learned image denoising with instance adaptation'. Together they form a unique fingerprint.

Cite this