Large-Velocity Saturation in Thin-Film Black Phosphorus Transistors

Xiaolong Chen, Chen Chen, Adi Levi, Lothar Houben, Bingchen Deng, Shaofan Yuan, Chao Ma, Kenji Watanabe, Takashi Taniguchi, Doron Naveh, Xu Du, Fengnian Xia

Research output: Contribution to journalArticlepeer-review

Abstract

A high saturation velocity semiconductor is appealing for applications in electronics and optoelectronics. Thin-film black phosphorus (BP), an emerging layered semiconductor, shows a high carrier mobility and strong mid-infrared photoresponse at room temperature. Here, we report the observation of high intrinsic saturation velocity in 7 to 11 rim thick BP for both electrons and holes as a function of charge-carrier density, temperature, and crystalline direction. We distinguish a drift velocity transition point due to the competition between the electron-impurity and electron phonon scatterings. We further achieve a room-temperature saturation velocity of 1.2 (1.0) X 10(7) cm s(-1) for hole (electron) carriers at a critical electric field of 14 (13) kV cm(-1), indicating current-gain cutoff frequency similar to 20 GHz center dot mu m for radio frequency applications. Moreover, the current density is as high as 580 mu A mu m(-1) at a low electric field of 10 kV cm(-1). Our studies demonstrate that thin-film BP outperforms silicon in terms of saturation velocity and critical field, revealing its great potential in radio-frequency electronics, high-speed mid-infrared photodetectors, and optical modulators.

Original languageEnglish
Pages (from-to)5003-5010
Number of pages8
JournalACS Nano
Volume12
Issue number5
DOIs
StatePublished - 22 May 2018

Keywords

  • black phosphorus
  • drift velocity
  • electron-impurity scattering
  • electron?phonon scattering
  • field-effect transistors
  • saturation velocity

All Science Journal Classification (ASJC) codes

  • General Engineering
  • General Materials Science
  • General Physics and Astronomy

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