Large resolution enhancement of x-ray microscopy using multipixel ghost imaging

O. Sefi; Y. Klein; A. Ben Yehuda; S. Bloch; H. Schwartz; E. Cohen; S. Shwartz

Large resolution enhancement of x-ray microscopy using multipixel ghost imaging

O. Sefi, Y. Klein, A. Ben Yehuda, S. Bloch, H. Schwartz, E. Cohen, S. Shwartz

Research output: Contribution to conference › Paper › peer-review

Abstract

We demonstrate resolution enhancement of a standard hard x-ray imaging system from 500 µm to approximately 20 µm by extending the concept of ghost imaging to multipixel ghost imaging, enabling mega-pixel scale imaging in a short timeframe.

Original language	English
State	Published - 2024
Event	CLEO: Applications and Technology in CLEO 2024, CLEO: A and T 2024 - Part of Conference on Lasers and Electro-Optics - Charlotte, United States Duration: 5 May 2024 → 10 May 2024

Conference

Conference	CLEO: Applications and Technology in CLEO 2024, CLEO: A and T 2024 - Part of Conference on Lasers and Electro-Optics
Country/Territory	United States
City	Charlotte
Period	5/05/24 → 10/05/24

All Science Journal Classification (ASJC) codes

General Computer Science
Space and Planetary Science
Control and Systems Engineering
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

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title = "Large resolution enhancement of x-ray microscopy using multipixel ghost imaging",

abstract = "We demonstrate resolution enhancement of a standard hard x-ray imaging system from 500 µm to approximately 20 µm by extending the concept of ghost imaging to multipixel ghost imaging, enabling mega-pixel scale imaging in a short timeframe.",

author = "O. Sefi and Y. Klein and Yehuda, \{A. Ben\} and S. Bloch and H. Schwartz and E. Cohen and S. Shwartz",

note = "Publisher Copyright: {\textcopyright} Optica Publishing Group 2024, {\textcopyright} 2024 The Author(s); CLEO: Applications and Technology in CLEO 2024, CLEO: A and T 2024 - Part of Conference on Lasers and Electro-Optics ; Conference date: 05-05-2024 Through 10-05-2024",

year = "2024",

language = "الإنجليزيّة",

}

TY - CONF

T1 - Large resolution enhancement of x-ray microscopy using multipixel ghost imaging

AU - Sefi, O.

AU - Klein, Y.

AU - Yehuda, A. Ben

AU - Bloch, S.

AU - Schwartz, H.

AU - Cohen, E.

AU - Shwartz, S.

PY - 2024

Y1 - 2024

N2 - We demonstrate resolution enhancement of a standard hard x-ray imaging system from 500 µm to approximately 20 µm by extending the concept of ghost imaging to multipixel ghost imaging, enabling mega-pixel scale imaging in a short timeframe.

AB - We demonstrate resolution enhancement of a standard hard x-ray imaging system from 500 µm to approximately 20 µm by extending the concept of ghost imaging to multipixel ghost imaging, enabling mega-pixel scale imaging in a short timeframe.

UR - http://www.scopus.com/inward/record.url?scp=85204954948&partnerID=8YFLogxK

M3 - محاضرة

T2 - CLEO: Applications and Technology in CLEO 2024, CLEO: A and T 2024 - Part of Conference on Lasers and Electro-Optics

Y2 - 5 May 2024 through 10 May 2024

ER -

Large resolution enhancement of x-ray microscopy using multipixel ghost imaging

Abstract

Conference

All Science Journal Classification (ASJC) codes

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