Abstract
In recent years, image-scanning microscopy (ISM, also termed pixel-reassignment microscopy) has emerged as a technique that improves the resolution and signal-to-noise compared to confocal and widefield microscopy by employing a detector array at the image plane of a confocal laser scanning microscope. Here, we present a k-space analysis of coherent ISM, showing that ISM is equivalent to spotlight synthetic-aperture radar and analogous to oblique-illumination microscopy. This insight indicates that ISM can be performed with a single detector placed in the k-space of the sample, which we numerically demonstrate.
| Original language | English |
|---|---|
| Article number | 141106 |
| Journal | Applied Physics Letters |
| Volume | 122 |
| Issue number | 14 |
| DOIs | |
| State | Published - 3 Apr 2023 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
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