@inbook{1b938e920ae745e1ae4ae6ec98e18e0a,
title = "Introduction to Scanning Electron Microscopy",
keywords = "Backscattered electrons, Contrast mechanisms, Dispersive X-ray spectroscopy, Electromagnetic lenses, Electron backscattered diffraction, Electron guns and detectors, Electron-matter interaction, Interaction volume, Resolution, Scanning electron microscope, Secondary electrons",
author = "Christina Scheu and Kaplan, {Wayne D.}",
year = "2012",
month = apr,
day = "24",
doi = "https://doi.org/10.1002/9783527652167.ch1",
language = "الإنجليزيّة",
isbn = "9783527319732",
pages = "1--37",
booktitle = "In-Situ Electron Microscopy",
}