Interlayer diffusion studies of a Laves phase exchange spring superlattice

C. Wang, A. Kohn, S. G. Wang, R. C.C. Ward

Research output: Contribution to journalArticlepeer-review


Rare earth Laves phase (RFe2) superlattice structures grown at different temperatures are studied using x-ray reflectivity (XRR), x-ray diffraction, and transmission electron microscopy. The optimized molecular beam epitaxy growth condition is matched with the XRR simulation, showing minimum diffusion/roughness at the interfaces. Electron microscopy characterization reveals that the epitaxial growth develops from initial 3D islands to a high quality superlattice structure. Under this optimum growth condition, chemical analysis by electron energy loss spectroscopy with high spatial resolution is used to study the interface. The analysis shows that the interface roughness is between 0.6 and 0.8nm and there is no significant interlayer diffusion. The locally sharp interface found in this work explains the success of simple structural models in predicting the magnetic reversal behavior of Laves exchange spring superlattices.

Original languageAmerican English
Article number116001
JournalJournal of Physics Condensed Matter
Issue number11
StatePublished - 23 Mar 2011

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • General Materials Science


Dive into the research topics of 'Interlayer diffusion studies of a Laves phase exchange spring superlattice'. Together they form a unique fingerprint.

Cite this