Interface Effects on Epilayer Surface Density of States by Scanning Tunneling Spectroscopy and Density Functional Theory

Matan Dascalu, Rachel Levi, Federico Cesura, Oswaldo Diéguez, Ilan Goldfarb

Research output: Contribution to journalArticlepeer-review

Abstract

Sub-nanometric Ni-silicide films are self-assembled by solid phase epitaxy of Ni on a vicinal Si(111) surface. The combination of in situ scanning tunneling microscopy and surface electron diffraction with ex situ X-ray photoelectron spectroscopy allows us to identify θ-Ni2Si as the major constituent crystal phase at the overgrown surface. Then scanning tunneling spectroscopy is employed with ab initio electronic structure calculations, to identify the origins of the surface local density of states and use these as a fingerprint for in situ phase identification. The above approach enhances the chemical contrast capability of scanning tunneling microscopy, and offers a useful local probe with atomic resolution for in situ crystal phase identification of ultra-thin surface structures.

Original languageEnglish
Article number1900140
JournalAdvanced Theory and Simulations
Volume2
Issue number12
DOIs
StatePublished - 1 Dec 2019

Keywords

  • density functional theory
  • density of states
  • epitaxial growth
  • scanning tunneling microscopy and spectroscopy
  • self-assembled nanostructure

All Science Journal Classification (ASJC) codes

  • General
  • Modelling and Simulation
  • Numerical Analysis
  • Statistics and Probability

Fingerprint

Dive into the research topics of 'Interface Effects on Epilayer Surface Density of States by Scanning Tunneling Spectroscopy and Density Functional Theory'. Together they form a unique fingerprint.

Cite this