Improving the performances of surface Plasmon resonance sensor in the infrared region by adding thin dielectric over-layer

Atef Shalabney; Ibrahim Abdulhalim

doi:10.1109/EEEI.2012.6377039

Improving the performances of surface Plasmon resonance sensor in the infrared region by adding thin dielectric over-layer

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The implications of adding thin dielectric film with high refractive index (RI) on top of the transducer metallic layer in surface Plasmon resonance (SPR) sensors are extensively investigated particularly in the infrared in the spectral mode. An over-layer made of silicon with thickness of about 10 nm is introduced on top of the silver metallic layer in SPR sensors when the Kretschmann-Raether (KR) configuration is used. The spectral interrogation is considered and the thickness of the dielectric over-layer is below the cutoff thickness of the lowest guided TM mode. The additional film causes to red-shift the resonance wavelength, narrowing of the dip in the reflectance spectrum, and enhancing the spectral sensitivity and the figure of merit (FOM) of the sensor. Furthermore, adding the top dielectric film enhances the electromagnetic fields at the analyte interface, increases the penetration depth inside the sensed medium, and improves the stability of the sensor.

Original language	American English
Title of host publication	2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012
DOIs	https://doi.org/10.1109/EEEI.2012.6377039
State	Published - 1 Dec 2012
Event	2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 - Eilat, Israel Duration: 14 Nov 2012 → 17 Nov 2012

Publication series

Name	2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012

Conference

Conference	2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012
Country/Territory	Israel
City	Eilat
Period	14/11/12 → 17/11/12

Keywords

optical biosensors
sensitivity enhancement
surface Plasmon resonance (SRP)

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/EEEI.2012.6377039

Cite this

Shalabney, A., & Abdulhalim, I. (2012). Improving the performances of surface Plasmon resonance sensor in the infrared region by adding thin dielectric over-layer. In 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 Article 6377039 (2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012). https://doi.org/10.1109/EEEI.2012.6377039

@inproceedings{6ab16771aee14919bbe7788f1458a2a5,

title = "Improving the performances of surface Plasmon resonance sensor in the infrared region by adding thin dielectric over-layer",

abstract = "The implications of adding thin dielectric film with high refractive index (RI) on top of the transducer metallic layer in surface Plasmon resonance (SPR) sensors are extensively investigated particularly in the infrared in the spectral mode. An over-layer made of silicon with thickness of about 10 nm is introduced on top of the silver metallic layer in SPR sensors when the Kretschmann-Raether (KR) configuration is used. The spectral interrogation is considered and the thickness of the dielectric over-layer is below the cutoff thickness of the lowest guided TM mode. The additional film causes to red-shift the resonance wavelength, narrowing of the dip in the reflectance spectrum, and enhancing the spectral sensitivity and the figure of merit (FOM) of the sensor. Furthermore, adding the top dielectric film enhances the electromagnetic fields at the analyte interface, increases the penetration depth inside the sensed medium, and improves the stability of the sensor.",

keywords = "optical biosensors, sensitivity enhancement, surface Plasmon resonance (SRP)",

author = "Atef Shalabney and Ibrahim Abdulhalim",

year = "2012",

month = dec,

day = "1",

doi = "10.1109/EEEI.2012.6377039",

language = "American English",

isbn = "9781467346801",

series = "2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012",

booktitle = "2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012",

note = "2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 ; Conference date: 14-11-2012 Through 17-11-2012",

}

Shalabney, A & Abdulhalim, I 2012, Improving the performances of surface Plasmon resonance sensor in the infrared region by adding thin dielectric over-layer. in 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012., 6377039, 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012, 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012, Eilat, Israel, 14/11/12. https://doi.org/10.1109/EEEI.2012.6377039

Improving the performances of surface Plasmon resonance sensor in the infrared region by adding thin dielectric over-layer. / Shalabney, Atef; Abdulhalim, Ibrahim.
2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012. 2012. 6377039 (2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Improving the performances of surface Plasmon resonance sensor in the infrared region by adding thin dielectric over-layer

AU - Shalabney, Atef

AU - Abdulhalim, Ibrahim

PY - 2012/12/1

Y1 - 2012/12/1

N2 - The implications of adding thin dielectric film with high refractive index (RI) on top of the transducer metallic layer in surface Plasmon resonance (SPR) sensors are extensively investigated particularly in the infrared in the spectral mode. An over-layer made of silicon with thickness of about 10 nm is introduced on top of the silver metallic layer in SPR sensors when the Kretschmann-Raether (KR) configuration is used. The spectral interrogation is considered and the thickness of the dielectric over-layer is below the cutoff thickness of the lowest guided TM mode. The additional film causes to red-shift the resonance wavelength, narrowing of the dip in the reflectance spectrum, and enhancing the spectral sensitivity and the figure of merit (FOM) of the sensor. Furthermore, adding the top dielectric film enhances the electromagnetic fields at the analyte interface, increases the penetration depth inside the sensed medium, and improves the stability of the sensor.

AB - The implications of adding thin dielectric film with high refractive index (RI) on top of the transducer metallic layer in surface Plasmon resonance (SPR) sensors are extensively investigated particularly in the infrared in the spectral mode. An over-layer made of silicon with thickness of about 10 nm is introduced on top of the silver metallic layer in SPR sensors when the Kretschmann-Raether (KR) configuration is used. The spectral interrogation is considered and the thickness of the dielectric over-layer is below the cutoff thickness of the lowest guided TM mode. The additional film causes to red-shift the resonance wavelength, narrowing of the dip in the reflectance spectrum, and enhancing the spectral sensitivity and the figure of merit (FOM) of the sensor. Furthermore, adding the top dielectric film enhances the electromagnetic fields at the analyte interface, increases the penetration depth inside the sensed medium, and improves the stability of the sensor.

KW - optical biosensors

KW - sensitivity enhancement

KW - surface Plasmon resonance (SRP)

UR - http://www.scopus.com/inward/record.url?scp=84871998697&partnerID=8YFLogxK

U2 - 10.1109/EEEI.2012.6377039

DO - 10.1109/EEEI.2012.6377039

M3 - Conference contribution

SN - 9781467346801

T3 - 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012

BT - 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012

T2 - 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012

Y2 - 14 November 2012 through 17 November 2012

ER -

Shalabney A, Abdulhalim I. Improving the performances of surface Plasmon resonance sensor in the infrared region by adding thin dielectric over-layer. In 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012. 2012. 6377039. (2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012). doi: 10.1109/EEEI.2012.6377039

Improving the performances of surface Plasmon resonance sensor in the infrared region by adding thin dielectric over-layer

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