Improving electron microscopy by shaping the electron beam wavefunction

Maor Mutzafi, Ido Kaminer, Gal Harari, Mordechai Segev

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We show a novel technique to enhance resolution and SNR in electron microscopes-by shaping the quantum wavefunction of electrons. Our technique overcomes fundamental limits that currently set the resolution and SNR in electron microscopy.

Original languageEnglish
Title of host publication2015 Conference on Lasers and Electro-Optics, CLEO 2015
ISBN (Electronic)9781557529688
StatePublished - 10 Aug 2015
EventConference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States
Duration: 10 May 201515 May 2015

Publication series

NameConference on Lasers and Electro-Optics Europe - Technical Digest
Volume2015-August

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2015
Country/TerritoryUnited States
CitySan Jose
Period10/05/1515/05/15

Keywords

  • Electron beam applications
  • Scanning electron microscopy
  • Shape
  • Transmission electron microscopy

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials

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