@inproceedings{f552784915ed46c0b253293da6c95991,
title = "Improvement in in-plane localization precision of nanoparticles using interference analysis",
abstract = "We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.",
keywords = "Cities and towns, Fitting, Gratings, Image resolution, Interference, Microscopy, Nanoparticles",
author = "Amihai Meiri and Ebeling, {Carl G.} and Jason Martineau and Zeev Zalevsky and Gerton, {Jordan M.} and Rajesh Menon",
note = "Publisher Copyright: {\textcopyright} 2015 OSA.; Conference on Lasers and Electro-Optics, CLEO 2015 ; Conference date: 10-05-2015 Through 15-05-2015",
year = "2015",
month = aug,
day = "10",
language = "الإنجليزيّة",
series = "Conference on Lasers and Electro-Optics Europe - Technical Digest",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2015 Conference on Lasers and Electro-Optics, CLEO 2015",
address = "الولايات المتّحدة",
}