Impact of surface treatments on I–V characteristics in Cd1−xZnxTe and Cd1−xMnxTe crystals

Artem Brovko; Arie Ruzin

doi:https://doi.org/10.1016/j.nima.2018.10.154

Impact of surface treatments on I–V characteristics in Cd_1−xZn_xTe and Cd_1−xMn_xTe crystals

Artem Brovko, Arie Ruzin

School of Electrical Engineering

Tel Aviv University

Research output: Contribution to journal › Review article › peer-review

Abstract

In this work, we focused on studying the impact of different surface treatments for Cd_1−xZn_xTe (CZT) and Cd_1−xMn_xTe (CMT) samples with indium evaporated contacts, specifically: mechanical polishing (MP), mechano-chemical polishing (MCP) and mechanical polishing followed by the chemical etching (MP+Et). We examined 3 samples in each group of Cd_0.85Zn_0.15Te and 3 samples in each group of Cd_0.93Mn_0.07Te. Devices were consecutively characterized by current–voltage dependence (I–V). The measured characteristics revealed that for CMT both surface treatments, including chemical exposure to bromine ethylene glycol in MCP or bromine methanol in etching, resulted in linear I–V characteristic consistent with the bulk resistance. At the same time, chemical treatments of CZT samples dramatically increased their current densities (up to several μA/cm²).

Original language	English
Pages (from-to)	46-47
Number of pages	2
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	936
DOIs	https://doi.org/10.1016/j.nima.2018.10.154
State	Published - 21 Aug 2019

Keywords

CdMnTe
CdZnTe
Surface
X-ray detectors

All Science Journal Classification (ASJC) codes

Nuclear and High Energy Physics
Instrumentation

Access to Document

https://doi.org/10.1016/j.nima.2018.10.154

Cite this

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title = "Impact of surface treatments on I–V characteristics in Cd1−xZnxTe and Cd1−xMnxTe crystals",

abstract = "In this work, we focused on studying the impact of different surface treatments for Cd1−xZnxTe (CZT) and Cd1−xMnxTe (CMT) samples with indium evaporated contacts, specifically: mechanical polishing (MP), mechano-chemical polishing (MCP) and mechanical polishing followed by the chemical etching (MP+Et). We examined 3 samples in each group of Cd0.85Zn0.15Te and 3 samples in each group of Cd0.93Mn0.07Te. Devices were consecutively characterized by current–voltage dependence (I–V). The measured characteristics revealed that for CMT both surface treatments, including chemical exposure to bromine ethylene glycol in MCP or bromine methanol in etching, resulted in linear I–V characteristic consistent with the bulk resistance. At the same time, chemical treatments of CZT samples dramatically increased their current densities (up to several μA/cm2).",

keywords = "CdMnTe, CdZnTe, Surface, X-ray detectors",

author = "Artem Brovko and Arie Ruzin",

note = "Publisher Copyright: {\textcopyright} 2018 Elsevier B.V.",

year = "2019",

month = aug,

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doi = "https://doi.org/10.1016/j.nima.2018.10.154",

language = "الإنجليزيّة",

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TY - JOUR

T1 - Impact of surface treatments on I–V characteristics in Cd1−xZnxTe and Cd1−xMnxTe crystals

AU - Brovko, Artem

AU - Ruzin, Arie

PY - 2019/8/21

Y1 - 2019/8/21

N2 - In this work, we focused on studying the impact of different surface treatments for Cd1−xZnxTe (CZT) and Cd1−xMnxTe (CMT) samples with indium evaporated contacts, specifically: mechanical polishing (MP), mechano-chemical polishing (MCP) and mechanical polishing followed by the chemical etching (MP+Et). We examined 3 samples in each group of Cd0.85Zn0.15Te and 3 samples in each group of Cd0.93Mn0.07Te. Devices were consecutively characterized by current–voltage dependence (I–V). The measured characteristics revealed that for CMT both surface treatments, including chemical exposure to bromine ethylene glycol in MCP or bromine methanol in etching, resulted in linear I–V characteristic consistent with the bulk resistance. At the same time, chemical treatments of CZT samples dramatically increased their current densities (up to several μA/cm2).

AB - In this work, we focused on studying the impact of different surface treatments for Cd1−xZnxTe (CZT) and Cd1−xMnxTe (CMT) samples with indium evaporated contacts, specifically: mechanical polishing (MP), mechano-chemical polishing (MCP) and mechanical polishing followed by the chemical etching (MP+Et). We examined 3 samples in each group of Cd0.85Zn0.15Te and 3 samples in each group of Cd0.93Mn0.07Te. Devices were consecutively characterized by current–voltage dependence (I–V). The measured characteristics revealed that for CMT both surface treatments, including chemical exposure to bromine ethylene glycol in MCP or bromine methanol in etching, resulted in linear I–V characteristic consistent with the bulk resistance. At the same time, chemical treatments of CZT samples dramatically increased their current densities (up to several μA/cm2).

KW - CdMnTe

KW - CdZnTe

KW - Surface

KW - X-ray detectors

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M3 - مقالة مرجعية

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JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

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