Abstract
Gain-cell-based embedded dynamic random-access memory (DRAMs) are a potential high-density alternative to mainstream static random-access memory (SRAM). However, the limited data retention time of ...
| Original language | English |
|---|---|
| Pages (from-to) | 19-22 |
| Number of pages | 4 |
| Journal | Journal of Engineering |
| Volume | 2013 |
| Issue number | 8 |
| DOIs | |
| State | Published - 1 Aug 2013 |
Keywords
- CMOS integrated circuits
- DRAM chips
- SRAM
- body biasing impact
- embedded systems
- gain cell array
- gain cell-based embedded DRAMs
- limited data retention time
- memory block
- periodic refresh cycles
- silicon measurements
- size 0.18 mum
- storage capacity 2 Kbit
- test chip
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