Imaging the field profile inside dielectric laser acceleration nanostructures

Tal Fishman, Urs Haeusler, Raphael Dahan, Michael Yannai, Yuval Adiv, Tom Lenkiewicz Abudy, Ori Eyal, Peyman Yousefi, Roy Shiloh, Gadi Eisenstein, Peter Hommelhoff, Ido Kaminer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present deep sub-wavelength measurement of the field distribution inside nanophotonic dielectric laser accelerator structures, using photon-induced nearfield electron microscopy. Comparing the measured field with theory provides new insight into accelerators' performance and structural sensitivity.

Original languageEnglish
Title of host publication2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171050
StatePublished - 2022
Event2022 Conference on Lasers and Electro-Optics, CLEO 2022 - San Jose, United States
Duration: 15 May 202220 May 2022

Publication series

Name2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings

Conference

Conference2022 Conference on Lasers and Electro-Optics, CLEO 2022
Country/TerritoryUnited States
CitySan Jose
Period15/05/2220/05/22

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Spectroscopy
  • Biomedical Engineering
  • Electrical and Electronic Engineering
  • Management, Monitoring, Policy and Law
  • Materials Science (miscellaneous)
  • Acoustics and Ultrasonics
  • Atomic and Molecular Physics, and Optics

Cite this