Imaging and applied optics: introduction to the feature issue

Zeev Zalevsky; Matthew R. Arnison; Bahram Javidi; Markus Testorf

doi:https://doi.org/10.1364/ao.57.00iao1

Imaging and applied optics: introduction to the feature issue

Zeev Zalevsky, Matthew R. Arnison, Bahram Javidi, Markus Testorf

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

Bar-Ilan University

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	IAO1-IAO2
Journal	APPLIED OPTICS
Volume	57
Issue number	7
DOIs	https://doi.org/10.1364/ao.57.00iao1
State	Published - 1 Mar 2018

All Science Journal Classification (ASJC) codes

Engineering (miscellaneous)
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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https://doi.org/10.1364/ao.57.00iao1

Cite this

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title = "Imaging and applied optics: introduction to the feature issue",

author = "Zeev Zalevsky and Arnison, {Matthew R.} and Bahram Javidi and Markus Testorf",

year = "2018",

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language = "الإنجليزيّة",

volume = "57",

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journal = "APPLIED OPTICS",

issn = "1559-128X",

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T2 - introduction to the feature issue

AU - Zalevsky, Zeev

AU - Arnison, Matthew R.

AU - Javidi, Bahram

AU - Testorf, Markus

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SN - 1559-128X

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SP - IAO1-IAO2

JO - APPLIED OPTICS

JF - APPLIED OPTICS

IS - 7

ER -

Imaging and applied optics: introduction to the feature issue

All Science Journal Classification (ASJC) codes

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