TY - JOUR
T1 - How to directly measure a Kondo cloud's length
AU - Park, Jinhong
AU - Lee, S. -S. B.
AU - Oreg, Yuval
AU - Sim, H. -S.
N1 - NRF [2011-0022955]; BSF Grant; Minerva GrantWe thank I. Affleck, G. Finkelstein, L. Glazman, D. Goldharber-Gordon, S. Ilani, A. K. Mitchell, and S. Tarucha for useful discussions, and Minchul Lee for advice on NRG calculations. We acknowledge support by NRF (Grant No. 2011-0022955; H.-S. S.), and by BSF and Minerva Grants (Y. O.). H.-S. S. thanks J. Moore and UC Berkeley, where this Letter was written, for hospitality.
PY - 2013/6/14
Y1 - 2013/6/14
N2 - We propose a method to directly measure, by electrical means, the Kondo screening cloud formed by an Anderson impurity coupled to semi-infinite quantum wires, on which an electrostatic gate voltage is applied at distance L from the impurity. We show that the Kondo cloud, and hence the Kondo temperature and the electron conductance through the impurity, are affected by the gate voltage, as L decreases below the Kondo cloud length. Based on this behavior, the cloud length can be experimentally identified by changing L with a keyboard type of gate voltage or tuning the coupling strength between the impurity and the wires.
AB - We propose a method to directly measure, by electrical means, the Kondo screening cloud formed by an Anderson impurity coupled to semi-infinite quantum wires, on which an electrostatic gate voltage is applied at distance L from the impurity. We show that the Kondo cloud, and hence the Kondo temperature and the electron conductance through the impurity, are affected by the gate voltage, as L decreases below the Kondo cloud length. Based on this behavior, the cloud length can be experimentally identified by changing L with a keyboard type of gate voltage or tuning the coupling strength between the impurity and the wires.
UR - http://www.scopus.com/inward/record.url?scp=84879112332&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.110.246603
DO - 10.1103/PhysRevLett.110.246603
M3 - مقالة
SN - 0031-9007
VL - 110
JO - Physical review letters
JF - Physical review letters
IS - 24
M1 - 246603
ER -