TY - JOUR
T1 - How Substitutional Point Defects in Two-Dimensional WS2 Induce Charge Localization, Spin-Orbit Splitting, and Strain
AU - Schuler, Bruno
AU - Lee, Jun-Ho
AU - Kastl, Christoph
AU - Cochrane, Katherine A.
AU - Chen, Christopher T.
AU - Refaely-Abramson, Sivan
AU - Yuan, Shengjun
AU - van Veen, Edo
AU - Roldan, Rafael
AU - Borys, Nicholas J.
AU - Koch, Roland J.
AU - Aloni, Shaul
AU - Schwartzberg, Adam M.
AU - Ogletree, D. Frank
AU - Neaton, Jeffrey B.
AU - Weber-Bargionit, Alexander
N1 - We would like to thank Thomas Seyller for help preparing the graphene on SiC substrates and Prokop Hapala for support with setting up the AFM simulations. This work was performed at the Molecular Foundry supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. B.S. appreciates support from the Swiss National Science Foundation under project number P2SKP2_171770. J.-H.L. and J.B.N. were supported by the Theory FWP, which is funded by the Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division, under Contract No. DE-AC02-05CH11231. C.K. gratefully acknowledges support by the Bavaria California Technology Center (BaCaTeC) and the International Graduate School of Science and Engineering (IGSSE) through project “CommOnChip”. A.W.-B. was supported by the U.S. Department of Energy Early Career Award. S.Y. acknowledges the financial support by the National Key R&D Program of China (Grant No. 2018FYA0305800) and computational resources provided by the Supercomputing Center of Wuhan University.
PY - 2019/9/24
Y1 - 2019/9/24
N2 - Control of impurity concentrations in semiconducting materials is essential to device technology. Because of their intrinsic confinement, the properties of two-dimensional semiconductors such as transition metal dichalcogenides (TMDs) are more sensitive to defects than traditional bulk materials. The technological adoption of TMDs is dependent on the mitigation of deleterious defects and guided incorporation of functional foreign atoms. The first step toward impurity control is the identification of defects and assessment of their electronic properties. Here, we present a comprehensive study of point defects in monolayer tungsten disulfide (WS2) grown by chemical vapor deposition using scanning tunneling microscopy/spectroscopy, CO-tip noncontact atomic force microscopy, Kelvin probe force spectroscopy, density functional theory, and tight-binding calculations. We observe four different substitutional defects: chromium (Cr-W) and molybdenum (Mo-W) at a tungsten site, oxygen at sulfur sites in both top and bottom layers (O-S top/bottom), and two negatively charged defects (CD type I and CD type II). Their electronic fingerprints unambiguously corroborate the defect assignment and reveal the presence or absence of in-gap defect states. Cr-W forms three deep unoccupied defect states, two of which arise from spin-orbit splitting. The formation of such localized trap states for Cr-W differs from the Mo-W case and can be explained by their different d shell energetics and local strain, which we directly measured. Utilizing a tight-binding model the electronic spectra of the isolectronic substitutions O-S and Cr-W are mimicked in the limit of a zero hopping term and infinite on-site energy at a S and W site, respectively. The abundant CDs are negatively charged, which leads to a significant band bending around the defect and a local increase of the contact potential difference. In addition, CD-rich domains larger than 100 nm are observed, causing a work function increase of 1.1 V. While most defects are electronically isolated, we also observed hybrid states formed between Cr-W dimers. The important role of charge localization, spin-orbit coupling, and strain for the formation of deep defect states observed at substitutional defects in WS2 as reported here will guide future efforts of targeted defect engineering and doping of TMDs.
AB - Control of impurity concentrations in semiconducting materials is essential to device technology. Because of their intrinsic confinement, the properties of two-dimensional semiconductors such as transition metal dichalcogenides (TMDs) are more sensitive to defects than traditional bulk materials. The technological adoption of TMDs is dependent on the mitigation of deleterious defects and guided incorporation of functional foreign atoms. The first step toward impurity control is the identification of defects and assessment of their electronic properties. Here, we present a comprehensive study of point defects in monolayer tungsten disulfide (WS2) grown by chemical vapor deposition using scanning tunneling microscopy/spectroscopy, CO-tip noncontact atomic force microscopy, Kelvin probe force spectroscopy, density functional theory, and tight-binding calculations. We observe four different substitutional defects: chromium (Cr-W) and molybdenum (Mo-W) at a tungsten site, oxygen at sulfur sites in both top and bottom layers (O-S top/bottom), and two negatively charged defects (CD type I and CD type II). Their electronic fingerprints unambiguously corroborate the defect assignment and reveal the presence or absence of in-gap defect states. Cr-W forms three deep unoccupied defect states, two of which arise from spin-orbit splitting. The formation of such localized trap states for Cr-W differs from the Mo-W case and can be explained by their different d shell energetics and local strain, which we directly measured. Utilizing a tight-binding model the electronic spectra of the isolectronic substitutions O-S and Cr-W are mimicked in the limit of a zero hopping term and infinite on-site energy at a S and W site, respectively. The abundant CDs are negatively charged, which leads to a significant band bending around the defect and a local increase of the contact potential difference. In addition, CD-rich domains larger than 100 nm are observed, causing a work function increase of 1.1 V. While most defects are electronically isolated, we also observed hybrid states formed between Cr-W dimers. The important role of charge localization, spin-orbit coupling, and strain for the formation of deep defect states observed at substitutional defects in WS2 as reported here will guide future efforts of targeted defect engineering and doping of TMDs.
UR - http://www.scopus.com/inward/record.url?scp=85071943305&partnerID=8YFLogxK
U2 - 10.1021/acsnano.9b04611
DO - 10.1021/acsnano.9b04611
M3 - مقالة
SN - 1936-0851
VL - 13
SP - 10520
EP - 10534
JO - ACS Nano
JF - ACS Nano
IS - 9
ER -