High-resolution Imaging with Scattered X-ray Radiation

A. Ben Yehuda; O. Sefi; E. Cohen; S. Shwartz

doi:10.1364/cleo_at.2023.am4q.7

High-resolution Imaging with Scattered X-ray Radiation

A. Ben Yehuda
, O. Sefi
, E. Cohen
, S. Shwartz

Bar-Ilan University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We demonstrate ghost imaging with scattered x-ray radiation for the first time and show that its spatial resolution is significantly higher than the resolution of standard present-day methods that rely on x-ray scattering.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	Applications and Technology, CLEO:A and T 2023
ISBN (Electronic)	9781957171258
DOIs	https://doi.org/10.1364/cleo_at.2023.am4q.7
State	Published - May 2023
Event	CLEO: Applications and Technology, CLEO:A and T 2023 - Part of Conference on Lasers and Electro-Optics 2023 - San Jose, United States Duration: 7 May 2023 → 12 May 2023

Publication series

Name	CLEO: Applications and Technology, CLEO:A and T 2023

Conference

Conference	CLEO: Applications and Technology, CLEO:A and T 2023 - Part of Conference on Lasers and Electro-Optics 2023
Country/Territory	United States
City	San Jose
Period	7/05/23 → 12/05/23

ASJC Scopus subject areas

General Computer Science
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Space and Planetary Science
Control and Systems Engineering
Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1364/cleo_at.2023.am4q.7

Cite this

@inproceedings{fddc1014660d4e71aab7fe673fc9c655,

title = "High-resolution Imaging with Scattered X-ray Radiation",

abstract = "We demonstrate ghost imaging with scattered x-ray radiation for the first time and show that its spatial resolution is significantly higher than the resolution of standard present-day methods that rely on x-ray scattering.",

author = "Yehuda, \{A. Ben\} and O. Sefi and E. Cohen and S. Shwartz",

note = "Publisher Copyright: CLEO 2023 {\textcopyright} Optica Publishing Group 2023, {\textcopyright} 2023 The Author(s); CLEO: Applications and Technology, CLEO:A and T 2023 - Part of Conference on Lasers and Electro-Optics 2023 ; Conference date: 07-05-2023 Through 12-05-2023",

year = "2023",

month = may,

doi = "10.1364/cleo\_at.2023.am4q.7",

language = "English",

series = "CLEO: Applications and Technology, CLEO:A and T 2023",

booktitle = "CLEO",

}

Yehuda, AB, Sefi, O, Cohen, E & Shwartz, S 2023, High-resolution Imaging with Scattered X-ray Radiation. in CLEO: Applications and Technology, CLEO:A and T 2023. CLEO: Applications and Technology, CLEO:A and T 2023, CLEO: Applications and Technology, CLEO:A and T 2023 - Part of Conference on Lasers and Electro-Optics 2023, San Jose, United States, 7/05/23. https://doi.org/10.1364/cleo_at.2023.am4q.7

TY - GEN

T1 - High-resolution Imaging with Scattered X-ray Radiation

AU - Yehuda, A. Ben

AU - Sefi, O.

AU - Cohen, E.

AU - Shwartz, S.

PY - 2023/5

Y1 - 2023/5

N2 - We demonstrate ghost imaging with scattered x-ray radiation for the first time and show that its spatial resolution is significantly higher than the resolution of standard present-day methods that rely on x-ray scattering.

AB - We demonstrate ghost imaging with scattered x-ray radiation for the first time and show that its spatial resolution is significantly higher than the resolution of standard present-day methods that rely on x-ray scattering.

UR - https://www.scopus.com/pages/publications/85191531998

U2 - 10.1364/cleo_at.2023.am4q.7

DO - 10.1364/cleo_at.2023.am4q.7

M3 - Conference contribution

T3 - CLEO: Applications and Technology, CLEO:A and T 2023

BT - CLEO

T2 - CLEO: Applications and Technology, CLEO:A and T 2023 - Part of Conference on Lasers and Electro-Optics 2023

Y2 - 7 May 2023 through 12 May 2023

ER -

High-resolution Imaging with Scattered X-ray Radiation

Abstract

Publication series

Conference

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this