High resolution DAS via sinusoidal frequency scan OFDR (SFS-OFDR)

Eyal Leviatan; Avishay Eyal

doi:10.1364/OE.23.033318

High resolution DAS via sinusoidal frequency scan OFDR (SFS-OFDR)

Eyal Leviatan, Avishay Eyal

School of Electrical Engineering

Tel Aviv University

Research output: Contribution to journal › Article › peer-review

Abstract

There are many advantages to using direct frequency modulation for OFDR based DAS. However, achieving sufficiently linear scan via direct frequency modulation is challenging and poses limits on the scan parameters. A novel method for analyzing sinusoidal frequency modulated light is presented and demonstrated for both static and dynamic sensing. SFS-OFDR projects the measured signal onto appropriate sinusoidal phase terms to obtain spatial information. Thus, by using SFS-OFDR on sinusoidal modulated light it is possible to make use of the many advantages offered by direct frequency modulation without the limitations posed by the linearity requirement.

Original language	English
Pages (from-to)	33318-33334
Number of pages	17
Journal	Optics Express
Volume	23
Issue number	26
DOIs	https://doi.org/10.1364/OE.23.033318
State	Published - 28 Dec 2015

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

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10.1364/OE.23.033318

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title = "High resolution DAS via sinusoidal frequency scan OFDR (SFS-OFDR)",

abstract = "There are many advantages to using direct frequency modulation for OFDR based DAS. However, achieving sufficiently linear scan via direct frequency modulation is challenging and poses limits on the scan parameters. A novel method for analyzing sinusoidal frequency modulated light is presented and demonstrated for both static and dynamic sensing. SFS-OFDR projects the measured signal onto appropriate sinusoidal phase terms to obtain spatial information. Thus, by using SFS-OFDR on sinusoidal modulated light it is possible to make use of the many advantages offered by direct frequency modulation without the limitations posed by the linearity requirement.",

author = "Eyal Leviatan and Avishay Eyal",

note = "Publisher Copyright: {\textcopyright} 2015 Optical Society of America.",

year = "2015",

month = dec,

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doi = "10.1364/OE.23.033318",

language = "الإنجليزيّة",

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AU - Eyal, Avishay

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Y1 - 2015/12/28

N2 - There are many advantages to using direct frequency modulation for OFDR based DAS. However, achieving sufficiently linear scan via direct frequency modulation is challenging and poses limits on the scan parameters. A novel method for analyzing sinusoidal frequency modulated light is presented and demonstrated for both static and dynamic sensing. SFS-OFDR projects the measured signal onto appropriate sinusoidal phase terms to obtain spatial information. Thus, by using SFS-OFDR on sinusoidal modulated light it is possible to make use of the many advantages offered by direct frequency modulation without the limitations posed by the linearity requirement.

AB - There are many advantages to using direct frequency modulation for OFDR based DAS. However, achieving sufficiently linear scan via direct frequency modulation is challenging and poses limits on the scan parameters. A novel method for analyzing sinusoidal frequency modulated light is presented and demonstrated for both static and dynamic sensing. SFS-OFDR projects the measured signal onto appropriate sinusoidal phase terms to obtain spatial information. Thus, by using SFS-OFDR on sinusoidal modulated light it is possible to make use of the many advantages offered by direct frequency modulation without the limitations posed by the linearity requirement.

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U2 - 10.1364/OE.23.033318

DO - 10.1364/OE.23.033318

M3 - مقالة

C2 - 26831997

SN - 1094-4087

VL - 23

SP - 33318

EP - 33334

JO - Optics Express

JF - Optics Express

IS - 26

ER -

High resolution DAS via sinusoidal frequency scan OFDR (SFS-OFDR)

Abstract

All Science Journal Classification (ASJC) codes

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