Graded bit-error-correcting codes with applications to flash memory

Ryan Gabrys; Eitan Yaakobi; Lara Dolecek

doi:10.1109/TIT.2012.2234207

Graded bit-error-correcting codes with applications to flash memory

Ryan Gabrys, Eitan Yaakobi, Lara Dolecek

Research output: Contribution to journal › Article › peer-review

Abstract

Flash memory is a promising new storage technology. Supported by empirical data collected from a Flash memory device, we propose a class of codes that exploits the asymmetric nature of the error patterns in a Flash device using tensor product operations. We call these codes graded bit-error-correcting codes. As demonstrated on the data collected from a Flash chip, these codes significantly delay the onset of errors and therefore have the potential to prolong the lifetime of the memory device.

Original language	English
Article number	6399599
Pages (from-to)	2315-2327
Number of pages	13
Journal	IEEE Transactions on Information Theory
Volume	59
Issue number	4
DOIs	https://doi.org/10.1109/TIT.2012.2234207
State	Published - Apr 2013
Externally published	Yes

Keywords

Coding theory
Error-correcting codes
Flash memory
Tensor product codes

All Science Journal Classification (ASJC) codes

Information Systems
Computer Science Applications
Library and Information Sciences

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10.1109/TIT.2012.2234207

Cite this

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abstract = "Flash memory is a promising new storage technology. Supported by empirical data collected from a Flash memory device, we propose a class of codes that exploits the asymmetric nature of the error patterns in a Flash device using tensor product operations. We call these codes graded bit-error-correcting codes. As demonstrated on the data collected from a Flash chip, these codes significantly delay the onset of errors and therefore have the potential to prolong the lifetime of the memory device.",

keywords = "Coding theory, Error-correcting codes, Flash memory, Tensor product codes",

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AB - Flash memory is a promising new storage technology. Supported by empirical data collected from a Flash memory device, we propose a class of codes that exploits the asymmetric nature of the error patterns in a Flash device using tensor product operations. We call these codes graded bit-error-correcting codes. As demonstrated on the data collected from a Flash chip, these codes significantly delay the onset of errors and therefore have the potential to prolong the lifetime of the memory device.

KW - Coding theory

KW - Error-correcting codes

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KW - Tensor product codes

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Graded bit-error-correcting codes with applications to flash memory

Abstract

Keywords

All Science Journal Classification (ASJC) codes

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