Generating flat-top beams with extended depth of focus

Vishwa Pal; Chene Tradonsky; Ronen Chriki; Natan Kaplan; Alexander Brodsky; Mickael Attia; Nir Davidson; Asher A. Friesem

doi:10.1364/AO.57.004583

Generating flat-top beams with extended depth of focus

Vishwa Pal, Chene Tradonsky, Ronen Chriki, Natan Kaplan, Alexander Brodsky, Mickael Attia, Nir Davidson, Asher A. Friesem

Department of Physics of Complex Systems

Weizmann Institute of Science

Research output: Contribution to journal › Article › peer-review

Abstract

Two approaches for generating flat-top beams (uniform intensity profile) with extended depth of focus are presented. One involves two diffractive optical elements (DOEs) and the other only a single DOE. The results indicate that the depth of focus of such beams strongly depends on the phase distribution at the output of the DOEs. By having uniform phase distribution, it is possible to generate flat-top beams with extended depth of focus. (C) 2018 Optical Society of America

Original language	English
Pages (from-to)	4583-4589
Number of pages	7
Journal	APPLIED OPTICS
Volume	57
Issue number	16
DOIs	https://doi.org/10.1364/AO.57.004583
State	Published - 1 Jun 2018

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10.1364/AO.57.004583

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title = "Generating flat-top beams with extended depth of focus",

abstract = "Two approaches for generating flat-top beams (uniform intensity profile) with extended depth of focus are presented. One involves two diffractive optical elements (DOEs) and the other only a single DOE. The results indicate that the depth of focus of such beams strongly depends on the phase distribution at the output of the DOEs. By having uniform phase distribution, it is possible to generate flat-top beams with extended depth of focus. (C) 2018 Optical Society of America",

author = "Vishwa Pal and Chene Tradonsky and Ronen Chriki and Natan Kaplan and Alexander Brodsky and Mickael Attia and Nir Davidson and Friesem, \{Asher A.\}",

note = "Israel Science Foundation (ISF); Magnet Project on Advanced Laser Technology for Industrial Applications (ALTIA).",

year = "2018",

month = jun,

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doi = "10.1364/AO.57.004583",

language = "الإنجليزيّة",

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AU - Pal, Vishwa

AU - Tradonsky, Chene

AU - Chriki, Ronen

AU - Kaplan, Natan

AU - Brodsky, Alexander

AU - Attia, Mickael

AU - Davidson, Nir

AU - Friesem, Asher A.

N1 - Israel Science Foundation (ISF); Magnet Project on Advanced Laser Technology for Industrial Applications (ALTIA).

PY - 2018/6/1

Y1 - 2018/6/1

N2 - Two approaches for generating flat-top beams (uniform intensity profile) with extended depth of focus are presented. One involves two diffractive optical elements (DOEs) and the other only a single DOE. The results indicate that the depth of focus of such beams strongly depends on the phase distribution at the output of the DOEs. By having uniform phase distribution, it is possible to generate flat-top beams with extended depth of focus. (C) 2018 Optical Society of America

AB - Two approaches for generating flat-top beams (uniform intensity profile) with extended depth of focus are presented. One involves two diffractive optical elements (DOEs) and the other only a single DOE. The results indicate that the depth of focus of such beams strongly depends on the phase distribution at the output of the DOEs. By having uniform phase distribution, it is possible to generate flat-top beams with extended depth of focus. (C) 2018 Optical Society of America

U2 - 10.1364/AO.57.004583

DO - 10.1364/AO.57.004583

M3 - مقالة

SN - 1559-128X

VL - 57

SP - 4583

EP - 4589

JO - APPLIED OPTICS

JF - APPLIED OPTICS

IS - 16

ER -

Generating flat-top beams with extended depth of focus

Abstract

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