Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene

Gregor Fessler; Baran Eren; Urs Gysin; Thilo Glatzel; Ernst Meyer

doi:10.1063/1.4863832

Friction force microscopy studies on SiO₂ supported pristine and hydrogenated graphene

Gregor Fessler, Baran Eren, Urs Gysin, Thilo Glatzel, Ernst Meyer

Research output: Contribution to journal › Article › peer-review

Abstract

A graphene sample supported on SiO₂ with pristine and plasma-hydrogenated parts is investigated by friction force microscopy. An initial contrast in friction is apparent between the two regions. A tip induced cleaning of the surface in the course of continuous scanning results in a very clean surface accompanied with a reduction of the friction force by a factor of up to 4. The contamination is adhering stronger to hydrogenated regions, but once cleaned, the frictional behavior is the same on pristine and hydrogenated graphene. Raman imaging demonstrates that the hydrogenation remains intact under the mechanical treatment.

Original language	English
Article number	041910
Journal	Applied Physics Letters
Volume	104
Issue number	4
DOIs	https://doi.org/10.1063/1.4863832
State	Published - 30 Jan 2014
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.4863832

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@article{23e0bce1ab994826b93c4abac86ca53e,

title = "Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene",

abstract = "A graphene sample supported on SiO2 with pristine and plasma-hydrogenated parts is investigated by friction force microscopy. An initial contrast in friction is apparent between the two regions. A tip induced cleaning of the surface in the course of continuous scanning results in a very clean surface accompanied with a reduction of the friction force by a factor of up to 4. The contamination is adhering stronger to hydrogenated regions, but once cleaned, the frictional behavior is the same on pristine and hydrogenated graphene. Raman imaging demonstrates that the hydrogenation remains intact under the mechanical treatment.",

author = "Gregor Fessler and Baran Eren and Urs Gysin and Thilo Glatzel and Ernst Meyer",

note = "Publisher Copyright: {\textcopyright} 2014 AIP Publishing LLC.",

year = "2014",

month = jan,

day = "30",

doi = "10.1063/1.4863832",

language = "الإنجليزيّة",

volume = "104",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "4",

}

TY - JOUR

T1 - Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene

AU - Fessler, Gregor

AU - Eren, Baran

AU - Gysin, Urs

AU - Glatzel, Thilo

AU - Meyer, Ernst

PY - 2014/1/30

Y1 - 2014/1/30

N2 - A graphene sample supported on SiO2 with pristine and plasma-hydrogenated parts is investigated by friction force microscopy. An initial contrast in friction is apparent between the two regions. A tip induced cleaning of the surface in the course of continuous scanning results in a very clean surface accompanied with a reduction of the friction force by a factor of up to 4. The contamination is adhering stronger to hydrogenated regions, but once cleaned, the frictional behavior is the same on pristine and hydrogenated graphene. Raman imaging demonstrates that the hydrogenation remains intact under the mechanical treatment.

AB - A graphene sample supported on SiO2 with pristine and plasma-hydrogenated parts is investigated by friction force microscopy. An initial contrast in friction is apparent between the two regions. A tip induced cleaning of the surface in the course of continuous scanning results in a very clean surface accompanied with a reduction of the friction force by a factor of up to 4. The contamination is adhering stronger to hydrogenated regions, but once cleaned, the frictional behavior is the same on pristine and hydrogenated graphene. Raman imaging demonstrates that the hydrogenation remains intact under the mechanical treatment.

UR - http://www.scopus.com/inward/record.url?scp=84906947669&partnerID=8YFLogxK

U2 - 10.1063/1.4863832

DO - 10.1063/1.4863832

M3 - مقالة

SN - 0003-6951

VL - 104

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 4

M1 - 041910

ER -

Friction force microscopy studies on SiO₂ supported pristine and hydrogenated graphene

Abstract

All Science Journal Classification (ASJC) codes

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