Free-electron-based interferometry for enhanced, phase-resolved near-field imaging

Tomer Bucher, Ron Ruimy, Raphael Dahan, Shai Tsesses, Guy Bartal, Giovanni Maria Vanacore, Ido Kaminer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose a novel scheme for phase-resolved near-field imaging using free electrons. Our scheme relies on algorithmic extraction of the complex-valued electron-field coupling. Pre-shaping the electron wavefunction facilitates superior sensitivity relative to the state-of-the-art.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationFundamental Science, CLEO:FS 2023
ISBN (Electronic)9781957171258
DOIs
StatePublished - 2023
EventCLEO: Fundamental Science, CLEO:FS 2023 - Part of Conference on Lasers and Electro-Optics 2023 - San Jose, United States
Duration: 7 May 202312 May 2023

Publication series

NameCLEO: Fundamental Science, CLEO:FS 2023

Conference

ConferenceCLEO: Fundamental Science, CLEO:FS 2023 - Part of Conference on Lasers and Electro-Optics 2023
Country/TerritoryUnited States
CitySan Jose
Period7/05/2312/05/23

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • General Computer Science
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Space and Planetary Science

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