Free-electron-based interferometry for enhanced, phase-resolved near-field imaging

Tomer Bucher, Ron Ruimy, Raphael Dahan, Shai Tsesses, Guy Bartal, Giovanni Maria Vanacore, Ido Kaminer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose a novel scheme for phase-resolved near-field imaging using free electrons. Our scheme relies on algorithmic extraction of the complex-valued electron-field coupling. Pre-shaping the electron wavefunction facilitates superior sensitivity relative to the state-of-the-art.

Original languageEnglish
Title of host publication2023 Conference on Lasers and Electro-Optics, CLEO 2023
ISBN (Electronic)9781957171258
StatePublished - 2023
Event2023 Conference on Lasers and Electro-Optics, CLEO 2023 - San Jose, United States
Duration: 7 May 202312 May 2023

Publication series

Name2023 Conference on Lasers and Electro-Optics, CLEO 2023

Conference

Conference2023 Conference on Lasers and Electro-Optics, CLEO 2023
Country/TerritoryUnited States
CitySan Jose
Period7/05/2312/05/23

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Artificial Intelligence
  • Instrumentation
  • Atomic and Molecular Physics, and Optics
  • Computer Science Applications

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