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Facilitating Atom Probe Tomography of 2D MXene Films by In Situ Sputtering

Mathias Krämer, Bar Favelukis, Maxim Sokol, Brian A. Rosen, Noam Eliaz, Se Ho Kim, Baptiste Gault

Research output: Contribution to journalArticlepeer-review

Abstract

2D materials are emerging as promising nanomaterials for applications in energy storage and catalysis. In the wet chemical synthesis of MXenes, these 2D transition metal carbides and nitrides are terminated with a variety of functional groups, and cations such as Li+ are often used to intercalate into the structure to obtain exfoliated nanosheets. Given the various elements involved in their synthesis, it is crucial to determine the detailed chemical composition of the final product, in order to better assess and understand the relationships between composition and properties of these materials. To facilitate atom probe tomography analysis of these materials, a revised specimen preparation method is presented in this study. A colloidal Ti3C2Tz MXene solution was processed into an additive-free free-standing film and specimens were prepared using a dual beam scanning electron microscope/focused ion beam. To mechanically stabilize the fragile specimens, they were coated using an in situ sputtering technique. As various 2D material inks can be processed into such free-standing films, the presented approach is pivotal for enabling atom probe analysis of other 2D materials.

Original languageAmerican English
Article numberozae035
Pages (from-to)1057-1065
Number of pages9
JournalMicroscopy and Microanalysis
Volume30
Issue number6
Early online date20 May 2024
DOIs
StatePublished - 1 Dec 2024

Keywords

  • 2D materials
  • MXenes
  • atom probe tomography
  • focused ion beam
  • in situ coating

All Science Journal Classification (ASJC) codes

  • Instrumentation

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