Experimentally quantifying the advantages of weak-values-based metrology

Gerardo I. Viza, Julian Martinez-Rincon, Gabriel B. Alves, Andrew N. Jordan, John C. Howell

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We measure small optical beam deflections both using a Sagnac interferometer with a monitored dark port (the weak-values-based technique), or by focusing the entire beam to a split detector (the standard technique). By introducing controlled external modulations we quantify the mitigation of these sources in the weak values-based experiment versus the standard focusing experiment. In all cases, the weak-values technique out performs the standard technique by up to two orders of magnitude in precision for our parameters. We also show by post-selecting on 1% of the photons, we obtain 99% of the available Fisher information.

Original languageAmerican English
Title of host publication2015 Conference on Lasers and Electro-Optics, CLEO 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781557529688
StatePublished - 10 Aug 2015
Externally publishedYes
EventConference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States
Duration: 10 May 201515 May 2015

Publication series

NameConference on Lasers and Electro-Optics Europe - Technical Digest
Volume2015-August

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2015
Country/TerritoryUnited States
CitySan Jose
Period10/05/1515/05/15

Keywords

  • Laser beams
  • Modulation
  • Noise
  • Optical beams
  • Photonics
  • Sagnac interferometers
  • Standards

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials

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