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EPiC: Ensemble of Partial Point Clouds for Robust Classification

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Robust point cloud classification is crucial for real-world applications, as consumer-type 3D sensors often yield partial and noisy data, degraded by various artifacts. In this work we propose a general ensemble framework, based on partial point cloud sampling. Each ensemble member is exposed to only partial input data. Three sampling strategies are used jointly, two local ones, based on patches and curves, and a global one of random sampling.We demonstrate the robustness of our method to various local and global degradations. We show that our framework significantly improves the robustness of top classification netowrks by a large margin. Our experimental setting uses the recently introduced ModelNet-C database by Ren et al. [24], where we reach SOTA both on unaugmented and on augmented data. Our unaugmented mean Corruption Error (mCE) is 0.64 (current SOTA is 0.86) and 0.50 for augmented data (current SOTA is 0.57). We analyze and explain these remarkable results through diversity analysis. Our code is availabe at: https://github.com/yossilevii100/EPiC

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Pages14429-14438
Number of pages10
ISBN (Electronic)9798350307184
DOIs
StatePublished - 2023
Event2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Paris, France
Duration: 2 Oct 20236 Oct 2023

Publication series

NameProceedings of the IEEE International Conference on Computer Vision

Conference

Conference2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Country/TerritoryFrance
CityParis
Period2/10/236/10/23

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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