Enhanced geometrical superresolved imaging with moving binary random mask

Amikam Borkowski; Zeev Zalevsky; Emanuel Marom; Bahram Javidi

doi:10.1364/JOSAA.28.000566

Enhanced geometrical superresolved imaging with moving binary random mask

Amikam Borkowski, Zeev Zalevsky, Emanuel Marom, Bahram Javidi

Tel Aviv University, Bar-Ilan University

Research output: Contribution to journal › Article › peer-review

Abstract

In this paper, we address the geometrical resolution limitation of an imaging sensor caused by the size of its pixels yielding insufficient spatial sampling of the image. The spatial blurring that is caused due to inadequate sampling can be resolved by placing a two-dimensional binary random mask in an intermediate image plane and shifting it along one direction while keeping the sensor as well as all other optical components fixed. Out of the set of images that are captured, a high resolution image can be decoded. In addition, this approach allows improved robustness to spatial noise.

Original language	English
Pages (from-to)	566-575
Number of pages	10
Journal	Journal of the Optical Society of America A: Optics and Image Science, and Vision
Volume	28
Issue number	4
DOIs	https://doi.org/10.1364/JOSAA.28.000566
State	Published - Apr 2011

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Computer Vision and Pattern Recognition

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10.1364/JOSAA.28.000566

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Enhanced geometrical superresolved imaging with moving binary random mask

Abstract

All Science Journal Classification (ASJC) codes

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