Ellipso-polarimetric schemes for improved surface plasmon resonance detection

Ibrahim Watad, Ibrahim Abdulhalim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


The majority of commercially available surface plasmon resonance (SPR) sensors rely solely on the detection of the intensity minimum of the reflected signal avoiding the extraction of the polarization properties. Such properties, i.e. the phase difference between polarization components and the azimuthal angle of the polarization ellipse, give sharper responses than the intensity which lead to a better measurement accuracy. Therefore, the lack of extraction of polarization properties in such devices significantly limits their performance. In this work we suggest different configurations of multifunctioning SPR sensing systems that can extract both the normalized reflectivity and the polarization properties simultaneously in the angular and spectral modes. This leads to a significant boost in the performance of existing SPR sensors as multi-parametric functioning systems.

Original languageAmerican English
Title of host publicationPhysics and Simulation of Optoelectronic Devices XXVII
EditorsMarek Osinski, Yasuhiko Arakawa, Bernd Witzigmann
ISBN (Electronic)9781510624665
StatePublished - 1 Jan 2019
EventPhysics and Simulation of Optoelectronic Devices XXVII 2019 - San Francisco, United States
Duration: 5 Feb 20197 Feb 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering


ConferencePhysics and Simulation of Optoelectronic Devices XXVII 2019
Country/TerritoryUnited States
CitySan Francisco


  • Optical sensors
  • Phase extraction
  • Polarimetry
  • Surface plasmons

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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