Electron rescattering in photoemission from metal tips as a nanoscale probe of near-field enhancement

Sebastian Thomas; Michael Kruger; Michael Forster; Peter Hommelhoff

doi:10.1109/CLEOE-IQEC.2013.6801158

Electron rescattering in photoemission from metal tips as a nanoscale probe of near-field enhancement

Sebastian Thomas, Michael Kruger, Michael Forster, Peter Hommelhoff

Research output: Contribution to conference › Paper › peer-review

Abstract

In the vicinity of nanostructures, the electric field strength of optical and infrared radiation is significantly enhanced. This near-field enhancement allows the localization of electromagnetic energy on a sub-wavelength scale (Fig. 1(a)). Because of the nanometric length scale, the coupling of light and matter, and the often unknown exact shape of the nanostructure in question, measuring and simulating optical near-fields has proven hard.

Original language	English
DOIs	https://doi.org/10.1109/CLEOE-IQEC.2013.6801158
State	Published - 2013
Externally published	Yes
Event	2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013 - Munich, Germany Duration: 12 May 2013 → 16 May 2013

Conference

Conference	2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013
Country/Territory	Germany
City	Munich
Period	12/05/13 → 16/05/13

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

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10.1109/CLEOE-IQEC.2013.6801158

Cite this

Thomas, S., Kruger, M., Forster, M., & Hommelhoff, P. (2013). Electron rescattering in photoemission from metal tips as a nanoscale probe of near-field enhancement. Paper presented at 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013, Munich, Germany. https://doi.org/10.1109/CLEOE-IQEC.2013.6801158

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title = "Electron rescattering in photoemission from metal tips as a nanoscale probe of near-field enhancement",

abstract = "In the vicinity of nanostructures, the electric field strength of optical and infrared radiation is significantly enhanced. This near-field enhancement allows the localization of electromagnetic energy on a sub-wavelength scale (Fig. 1(a)). Because of the nanometric length scale, the coupling of light and matter, and the often unknown exact shape of the nanostructure in question, measuring and simulating optical near-fields has proven hard.",

author = "Sebastian Thomas and Michael Kruger and Michael Forster and Peter Hommelhoff",

year = "2013",

doi = "10.1109/CLEOE-IQEC.2013.6801158",

language = "الإنجليزيّة",

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Thomas, S, Kruger, M, Forster, M & Hommelhoff, P 2013, 'Electron rescattering in photoemission from metal tips as a nanoscale probe of near-field enhancement', Paper presented at 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013, Munich, Germany, 12/05/13 - 16/05/13. https://doi.org/10.1109/CLEOE-IQEC.2013.6801158

Electron rescattering in photoemission from metal tips as a nanoscale probe of near-field enhancement. / Thomas, Sebastian; Kruger, Michael; Forster, Michael et al.
2013. Paper presented at 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013, Munich, Germany.

Research output: Contribution to conference › Paper › peer-review

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T1 - Electron rescattering in photoemission from metal tips as a nanoscale probe of near-field enhancement

AU - Thomas, Sebastian

AU - Kruger, Michael

AU - Forster, Michael

AU - Hommelhoff, Peter

PY - 2013

Y1 - 2013

N2 - In the vicinity of nanostructures, the electric field strength of optical and infrared radiation is significantly enhanced. This near-field enhancement allows the localization of electromagnetic energy on a sub-wavelength scale (Fig. 1(a)). Because of the nanometric length scale, the coupling of light and matter, and the often unknown exact shape of the nanostructure in question, measuring and simulating optical near-fields has proven hard.

AB - In the vicinity of nanostructures, the electric field strength of optical and infrared radiation is significantly enhanced. This near-field enhancement allows the localization of electromagnetic energy on a sub-wavelength scale (Fig. 1(a)). Because of the nanometric length scale, the coupling of light and matter, and the often unknown exact shape of the nanostructure in question, measuring and simulating optical near-fields has proven hard.

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U2 - 10.1109/CLEOE-IQEC.2013.6801158

DO - 10.1109/CLEOE-IQEC.2013.6801158

M3 - محاضرة

T2 - 2013 Conference on Lasers and Electro-Optics Europe and International Quantum Electronics Conference, CLEO/Europe-IQEC 2013

Y2 - 12 May 2013 through 16 May 2013

ER -

Electron rescattering in photoemission from metal tips as a nanoscale probe of near-field enhancement

Abstract

Conference

All Science Journal Classification (ASJC) codes

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