Electron Microscopy Study of ALD Protective Coating on the FeOF Electrode

Chuan-Fu Lin, Sz-Chian Liou, Malachi Noked, Wen-An Chiou, Gary Rubloff

Research output: Contribution to journal › Article › peer-review

Original language	American English
Pages (from-to)	2056-2057
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	23
Issue number	Suppl 1
DOIs	https://doi.org/10.1017/S1431927617010947
State	Published - 2017
Externally published	Yes

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title = "Electron Microscopy Study of ALD Protective Coating on the FeOF Electrode",

author = "Chuan-Fu Lin and Sz-Chian Liou and Malachi Noked and Wen-An Chiou and Gary Rubloff",

note = "{\textcopyright} Microscopy Society of America 2017",

year = "2017",

doi = "https://doi.org/10.1017/S1431927617010947",

language = "American English",

volume = "23",

pages = "2056--2057",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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}

TY - JOUR

T1 - Electron Microscopy Study of ALD Protective Coating on the FeOF Electrode

AU - Lin, Chuan-Fu

AU - Liou, Sz-Chian

AU - Noked, Malachi

AU - Chiou, Wen-An

AU - Rubloff, Gary

PY - 2017

Y1 - 2017

UR - https://www.mendeley.com/catalogue/e7eaec69-5de1-3aeb-b79a-6c855dce7a6e/

U2 - https://doi.org/10.1017/S1431927617010947

DO - https://doi.org/10.1017/S1431927617010947

M3 - Article

SN - 1431-9276

VL - 23

SP - 2056

EP - 2057

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Suppl 1

ER -