Abstract
This is a preliminary investigation on the mechanical properties of Pb-free Sn-1.0Ag-0.5Cu solder joints containing 0.02 wt.% to 0.1 wt.% Y under a range of thermal aging and reflow conditions. Despite the significantly thicker intermetallic compound (IMC) formed at the solder joint, the 0.1 wt.% Y-doped joint exhibited a higher fracture strength than its baseline Sn-1.0Ag-0.5Cu counterpart under most aging and reflow conditions. This may be associated with the formation of Y-Cu IMCs formed at the interface between the solder and the Cu substrate, because the Y-Cu IMCs have recently been referred to as relatively ‘ductile’ IMCs.
Original language | English |
---|---|
Pages (from-to) | 3259-3262 |
Number of pages | 4 |
Journal | Journal of Electronic Materials |
Volume | 45 |
Issue number | 7 |
DOIs | |
State | Published - 1 Jul 2016 |
Keywords
- Aging
- fracture
- impact behavior
- intermetallics
- solder
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry