Effect of Yttrium on the Fracture Strength of the Sn-1.0Ag-0.5Cu Solder Joints

Hyelim Choi, Wayne D. Kaplan, Heeman Choe

Research output: Contribution to journalArticlepeer-review

Abstract

This is a preliminary investigation on the mechanical properties of Pb-free Sn-1.0Ag-0.5Cu solder joints containing 0.02 wt.% to 0.1 wt.% Y under a range of thermal aging and reflow conditions. Despite the significantly thicker intermetallic compound (IMC) formed at the solder joint, the 0.1 wt.% Y-doped joint exhibited a higher fracture strength than its baseline Sn-1.0Ag-0.5Cu counterpart under most aging and reflow conditions. This may be associated with the formation of Y-Cu IMCs formed at the interface between the solder and the Cu substrate, because the Y-Cu IMCs have recently been referred to as relatively ‘ductile’ IMCs.

Original languageEnglish
Pages (from-to)3259-3262
Number of pages4
JournalJournal of Electronic Materials
Volume45
Issue number7
DOIs
StatePublished - 1 Jul 2016

Keywords

  • Aging
  • fracture
  • impact behavior
  • intermetallics
  • solder

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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