Direct observation of electromagnetic near field in silicon nanophotonics devices using Scanning Thermal Microscopy (SThM) technique

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2014
DOIs
StatePublished - 2014
Externally publishedYes
EventCLEO: Science and Innovations, CLEO_SI 2014 - San Jose, CA, United States
Duration: 8 Jun 201413 Jun 2014

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceCLEO: Science and Innovations, CLEO_SI 2014
Country/TerritoryUnited States
CitySan Jose, CA
Period8/06/1413/06/14

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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